This tool from the series of BE Precision Technology Probe Card Analyzers allows users of even very complex Probe Cards a contactless, superfast scanning over an area as large as 200mm by 200 mm.
Among various other tasks (i.e. Pass/Fail information of a particular Probe Card) the “INSPECTOR” allows you to scan ultra-fast for planarity as well as for Beam Clearance. The “INSPECTOR” is designed for contactless treatment of all brands and all types of Probe Cards (i.e. Cantilever, Vertical, Membrane, Cobra, MEMS).